Theory of orientation averaging in x-ray spectroscopies: Understanding polarization dependence in a Cartesian tensor approach
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论文直接处理 XAS 和 RIXS 的偏振依赖及粉末样品取向平均，为从实验谱强度解释电子和轨道激发提供方法基础。
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Author(s): Sihan Zhang (张思翰), Oana Bunău, Marius Retegan, and Pieter Glatzel X-ray absorption spectroscopy (XAS) and resonant inelastic x-ray scattering (RIXS) are powerful probes of electronic structure owing to their chemical and orbital selectivity. For powder samples, however, interpreting RIXS spectral intensities remains challenging as the measured signal is an average… [Phys. Rev. B 114, 045133] Published Thu Jul 30, 2026